2008 - Planar patch-clamp force microscopy on living cells

icon pap  Port-a-Patch publication in Ultramicroscopy (2008)

Authors: 
Pamir E., George M., Fertig N., Benoit M.

 

Journal: 
Ultramicroscopy (2008) 108(6):552-557


Abstract:

Here we report a new combination of the patch-clamp technique with the atomic force microscope (AFM). A planar patch-clamp chip microstructured from borosilicate glass was used as a support for mechanical probing of living cells. The setup not only allows for immobilizing even a non-adherent cell for measurements of its mechanical properties, but also for simultaneously measuring the electrophysiological properties of a single cell. As a proof of principle experiment we measured the voltage-induced membrane movement of HEK293 and Jurkat cells in the whole-cell voltage clamp configuration. The results of these measurements are in good agreement with previous studies. By using the planar patch-clamp chip for immobilization, the AFM not only can image non-adhering cells, but also gets easily access to an electrophysiologically controlled cellular probe at low vibrational noise.

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